DONNADIEU, Patricia; MATSUDA, Kenji; EPICIER, Thierry; DOUIN, Joel. MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD. Image Analysis and Stereology, [S. l.], v. 20, n. 3, p. 213–218, 2011. DOI: 10.5566/ias.v20.p213-218. Disponível em: https://www.ias-iss.org/ojs/IAS/article/view/682. Acesso em: 13 jun. 2024.