JERNOT, Jean-Paul; JOUANNOT-CHESNEY, Patricia; LANTUÉJOUL, Christian; NOUET, Gérard; RUTERANA, Pierre. TOPOLOGICAL LOCALISATION OF DEFECTS AT ATOMIC SCALE. Image Analysis and Stereology, Ljubljana, Slovenia, v. 21, n. 3, p. 191–198, 2011. DOI: 10.5566/ias.v21.p191-198. Disponível em: https://www.ias-iss.org/ojs/IAS/article/view/713. Acesso em: 3 oct. 2024.