Kestener, Pierre, Jean Marc Lina, Philippe Saint-Jean, and Alain Arneodo. “WAVELET-BASED MULTIFRACTAL FORMALISM TO ASSIST IN DIAGNOSIS IN DIGITIZED MAMMOGRAMS”. Image Analysis and Stereology 20, no. 3 (May 3, 2011): 169–174. Accessed April 29, 2024. https://www.ias-iss.org/ojs/IAS/article/view/674.