Donnadieu P, Matsuda K, Epicier T, Douin J. MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD. Image Anal Stereol [Internet]. 2011 May 3 [cited 2024 Apr. 30];20(3):213-8. Available from: https://www.ias-iss.org/ojs/IAS/article/view/682