A TESSELLATION MODEL FOR CRACK PATTERNS ON SURFACES

Werner Nagel, Joseph Mecke, Joachim Ohser, Viola Weiss

Abstract

This paper presents a model of random tessellations that reflect several features of crack pattern. There are already several theoretical results derivedwhich indicate that thismodel can be an appropriate referencemodel. Some potential applications are presented in a tentative statistical study.

Keywords
crack pattern; random tessellations; spatial statistics; stochastic geometry

Full Text:

PDF


DOI: 10.5566/ias.v27.p73-78

Image Analysis & Stereology
EISSN 1854-5165 (Electronic version)
ISSN 1580-3139 (Printed version)